English
- إرجاع مجاني بسهولة
- أفضل عروض
المواصفات
| الناشر | Springer Science+Business Media |
| رقم الكتاب المعياري الدولي 13 | 9780306421402 |
| اللغة | الإنجليزية |
| وصف الكتاب | This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course. |
| عن المؤلف | Joseph Goldstein has been leading retreats and seminars in Buddhist meditation worldwide since 1974 and is a co-founder of the Insight Meditation Society. He began his practice in 1967 when he came across Buddhism as a peace activist in Thailand. Today he is considered to be one of the leading representatives of Western Buddhism. He published the book Insight through Meditation in German (together with Jack Kornfield). |
| تاريخ النشر | 31 Mar 1986 |
| عدد الصفحات | 454 |
Advanced Scanning Electron Microscopy And X-Ray Microanalysis hardcover english - 31 Mar 1986
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