Publisher | Springer-Verlag New York Inc. |
ISBN 13 | 9781461440772 |
ISBN 10 | 1461440777 |
Book Format | Hardcover |
Language | English |
Editor | Ricardo Reis , Edited by Yu Cao , Edited by Gilson Wirth, Yu Cao, Gilson Wirth |
Book Description | This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. |
Publication Date | 14 Dec 2014 |
Number of Pages | 272 |
Circuit Design For Reliability Hardcover English - 14 Dec 2014