Specifications
| Publisher | CRC Press |
| ISBN 13 | 9780367445843 |
| Author | Michael Nastasi |
| Book Format | Paperback |
| Language | English |
| Book Subtitle | Fundamentals And Applications |
| Book Description | Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. The book explains how ions interact with solids and describes what information can be gained. It starts by covering the fundamentals of ion beam analysis, including kinematics, ion stopping, Rutherford backscattering, channeling, elastic recoil detection, particle induced x-ray emission, and nuclear reaction analysis. The second part turns to applications, looking at the broad range of potential uses in thin film reactions, ion implantation, nuclear energy, biology, and art/archaeology. |
| Edition Number | 1st Edition |
| Publication Date | 25-Nov-19 |
| Number of Pages | 472 |
Ion Beam Analysis paperback english - 25-Nov-19
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