New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies)
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Highlights
- Original Copies - From Publishers
Specifications
| Publisher | Elsevier |
| ISBN 13 | 9780323241434 |
| ISBN 10 | 323241433 |
| Language | English |
| Author | Zeev Zalevsky, Pavel Livshits, Eran Gur |
| Edition Number | 1 |
| Publication Date | 2014 |
New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices (Micro and Nano Technologies)
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