English
- استرجاع مجاني وسهل
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المواصفات
| الناشر | Springer-Verlag New York Inc. |
| رقم الكتاب المعياري الدولي 13 | 9781461492658 |
| رقم الكتاب المعياري الدولي 10 | 1461492653 |
| اللغة | الإنجليزية |
| العنوان الفرعي للكتاب | From Microstructures To Reliability |
| وصف الكتاب | This unique book provides an up-to-date overview of the concepts behind lead-free soldering techniques. Readers will find a description of the physical and mechanical properties of lead-free solders, in addition to lead-free electronics and solder alloys. Additional topics covered include the reliability of lead-free soldering, tin whiskering and electromigration, in addition to emerging technologies and research. |
| المراجعة التحريرية | The book gives wide perspectives on the technical insights of lead-free solder interconnect system and reliability prediction in industry while adding very valuable industry insights. It is a good resource to demonstrate the many facets of lead-free solder interconnection, and can serve as a very informative technical reference. Valuable as a learning tool for fundamentals of lead-free solder interconnect technology, its clear relevance to real world industry practices make it useful for both academics and semiconductor industry practitioners." (Chong Leong Gan and Uda Hashim, Microelectronics Reliability, February, 2015) |
| تاريخ النشر | 01 Dec 2014 |
| عدد الصفحات | 253 |
Fundamentals Of Lead-free Solder Interconnect Technology : From Microstructures To Reliability Hardcover English by Tae-Kyu Lee - 01 Dec 2014
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