Specifications
| Publisher | Springer Science+Business Media |
| ISBN 13 | 9780306472923 |
| ISBN 10 | 0306472929 |
| Book Description | <p>This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.</p> |
| Language | English |
| Author | Joseph Goldstein, Dale E. Newbury |
| Edition Number | 3rd Corrected ed. 2003. Corr. 2nd printing 2007 |
Scanning Electron Microscopy And X-Ray Microanalysis hardcover english
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