English
- استرجاع مجاني وسهل
- أفضل العروض
1
متوفر قريبا
المواصفات
| الناشر | Springer-Verlag Berlin and Heidelberg GmbH And Co. KG |
| رقم الكتاب المعياري الدولي 13 | 9783540738855 |
| رقم الكتاب المعياري الدولي 10 | 3540738851 |
| اللغة | الإنجليزية |
| العنوان الفرعي للكتاب | 3 |
| وصف الكتاب | This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. |
| تاريخ النشر | 04 Dec 2007 |
| عدد الصفحات | 780 |
Transmission Electron Microscopy And Diffractometry Of Materials Hardcover English by Brent Fultz - 04 Dec 2007
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