Advanced Scanning Electron Microscopy And X-Ray Microanalysis hardcover english - 31 Mar 1986
Now:
AED 390.00 Inclusive of VAT
Free Delivery
Only 2 left in stockFree DeliveryOnly 2 left in stock
Get it by 22 Nov
Earn AED 19.50 cashback with the Mashreq noon Credit Card. Apply now
Pay 4 interest-free payments of AED 97.50.Learn more
Split in 4 payments of AED 97.50. No interest. No late fees.Learn more
1
Free delivery on Lockers & Pickup Points
Learn more
Enjoy hassle free returns with this offer.
Item as Described
70%
Partner Since
4+ YearsSpecifications
| Publisher | Springer Science+Business Media |
| ISBN 13 | 9780306421402 |
| Book Description | This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course. |
| About the Author | Joseph Goldstein has been leading retreats and seminars in Buddhist meditation worldwide since 1974 and is a co-founder of the Insight Meditation Society. He began his practice in 1967 when he came across Buddhism as a peace activist in Thailand. Today he is considered to be one of the leading representatives of Western Buddhism. He published the book Insight through Meditation in German (together with Jack Kornfield). |
| Language | English |
| Author | Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury |
| Publication Date | 31 Mar 1986 |
| Number of Pages | 454 |
Advanced Scanning Electron Microscopy And X-Ray Microanalysis hardcover english - 31 Mar 1986
Added to cart
Cart Total AED 390.00
