Transmission Electron Microscopy: Physics of Image Formation
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Specifications
| Publisher | Springer |
| ISBN 13 | 9781441923080 |
| ISBN 10 | 144192308X |
| Author | Ludwig Reimer |
| Book Format | Paperback |
| Language | English |
| Book Description | Particle Optics of Electrons.- Wave Optics of Electrons.- Elements of a Transmission Electron Microscope.- Electron-Specimen Interactions..- Scattering and Phase Contrast.- Theory of Electron Diffraction.- Electron-Diffraction Modesand Applications ..- Imaging of Crystalline Specimens and Their Defects..- Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy..- Specimen Damage by Electron Irradiation. |
| Publication Date | 19 November 2010 |
| Number of Pages | 608 pages |
Transmission Electron Microscopy: Physics of Image Formation
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